Understanding Semiconductors: Modern Metrology from Lab to Fab
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Increased Metrology Means Increased Data. So what Do We Do With It? w/ Alex Liddle - Scientific Director at NIST
The National Institute of Standards and Technology (NIST) is a physical sciences laboratory and non-regulatory agency of the United States Department of Commerce. NIST's activities are organized into laboratory programs that include nanoscale science and technology, engineering, information technology, neutron research, material measurement, and physical measurement. In today’s episode Markus speaks with Alex Liddle, Scientific Director at NIST. They discuss: Alex’s Career Journey to NIST Dimensional Metrology The Measurement of a Test Structure vs. the Actual Structure and CoverageThe trend to measure everything you can across the wafer Key Trends Alex noticed at this years Frontiers conference Stochastic Failures, Lithography and Reliability Reach out to Markus for any potential guest requests or episode ideas here: https://www.linkedin.com/in/markus-kuhn-4b502110/ For the latest in new Metrology Techniques and Solutions check out https://rsmd.rigaku.com/ To make sure you never miss an episode of Understanding Semiconductors, subscribe on Apple Podcasts, Spotify, and the website. Listening on a desktop & can’t see the links? Just search for Understanding Semiconductors in your favorite podcast player.
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